amorphous solids

In condensed matter physics and materials science, an amorphous solid (or non-crystalline solid, glassy solid) is a solid that lacks the long-range order that is characteristic of a crystal.

Etymology

The term comes from the Greek ''a'' ("without"), and ''morphé'' ("shape, form"). In some older articles and books, the term was used synonymously with glass. Today, "glassy solid" or "amorphous solid" is considered the overarching concept. Polymers are often amorphous.

Structure

Amorphous materials have an internal structure comprising interconnected structural blocks that can be similar to the basic structural units found in the corresponding crystalline phase of the same compound. Unlike crystalline materials, however, no long-range order exists. Localized order in amorphous materials can be categorized as short or medium range order. By convention, short range order extends only to the nearest neighbor shell, typically only 1-2 atomic spacings. Medium range order is then defined as the structural organization extending beyond the short range order, usually by 1-2 nm. Whether a material is liquid or solid depends primarily on the connectivity between its building blocks; solids are characterized by a higher degree of connectivity than fluids.

Nano-structured materials

Amorphous materials will have some degree of short-range order at the atomic-length scale due to the nature of intermolecular chemical bonding. Furthermore, in very small crystals, short-range order encompasses a large fraction of the atoms; nevertheless, relaxation at the surface, along with interfacial effects, distorts the atomic positions and decreases structural order. Even the most advanced structural characterization techniques, such as X-ray diffraction and transmission electron microscopy, have difficulty distinguishing amorphous and crystalline structures at short-length scales.

Characterization of amorphous solids

Due to the lack of long-range order, standard crystallographic techniques are often inadequate in determining the structure of amorphous solids. A variety of electron, X-ray, and computation-based techniques have been used to characterize amorphous materials. Multi-modal analysis is very common for amorphous materials.

X-ray and neutron diffraction

Unlike crystalline materials which exhibit strong Bragg diffraction, the diffraction patterns of amorphous materials are characterized by broad and diffuse peaks. As a result, detailed analysis and complementary techniques are required to extract real space structural information from the diffraction patterns of amorphous materials. It is useful to obtain diffraction data from both X-ray and neutron sources as they have different scattering properties and provide complementary data. Pair distribution function analysis can be performed on diffraction data to determine the probability of finding a pair of atoms separated by a certain distance. Another type of analysis that is done with diffraction data of amorphous materials is radial distribution function analysis, which measures the number of atoms found at varying radial distances away from an arbitrary reference atom. From these techniques, the local order of an amorphous material can be elucidated.

X-ray absorption fine-structure spectroscopy

X-ray absorption fine-structure spectroscopy is an atomic scale probe making it useful for studying materials lacking in long range order. Spectra obtained by using this method provide information on the oxidation state, coordination number, and species surrounding the atom in question as well as the distances at which they are found.

Atomic electron tomography

The atomic electron tomography technique is performed in transmission electron microscopes capable of reaching sub-Angstrom resolution. A collection of 2D images taken at numerous different tilt angles is acquired from the sample in question, and then used to reconstruct a 3D image. After image acquisition, a significant amount of processing must be done to correct for issues such as drift, noise, and scan distortion. High quality analysis and processing using atomic electron tomography results in a 3D reconstruction of an amorphous material detailing the atomic positions of the different species that are present.

Fluctuation electron microscopy

Fluctuation electron microscopy is another transmission electron microscopy based technique that is sensitive to the medium range order of amorphous materials. Structural fluctuations arising from different forms of medium range order can be detected with this method. Fluctuation electron microscopy experiments can be done in conventional or scanning transmission electron microscopy.

Computational techniques

Simulation and modeling techniques are often combined with experimental methods to characterize structures of amorphous materials. Commonly used computational techniques include, density functional theory, molecular dynamics, and reverse Monte Carlo.

Uses and observations

Amorphous thin films

Amorphous phases are important constituents of thin films. Thin films are solid layers of a few nanometres to tens of micrometres thickness that are deposited onto a substrate. So-called structure zone models were developed to describe the microstructure of thin films as a function of the homologous temperature (''T_h''), which is the ratio of deposition temperature to melting temperature.
Russian-language version: ''Fiz. Metal Metalloved'' (1969) 28: 653-660. According to these models, a necessary condition for the occurrence of amorphous phases is that (''T_h'') has to be smaller than 0.3. The deposition temperature must be below 30% of the melting temperature.

Superconductivity

Regarding their applications, amorphous metallic layers played an important role in the discovery of superconductivity in amorphous metals made by Buckel and Hilsch. The superconductivity of amorphous metals, including amorphous metallic thin films, is now understood to be due to phonon-mediated Cooper pairing. The role of