|
Fault Coverage
Fault coverage refers to the percentage of some type of fault that can be detected during the test of any engineered system. High fault coverage is particularly valuable during manufacturing test, and techniques such as Design For Test (DFT) and automatic test pattern generation are used to increase it. Applications Digital electronics In digital electronics, fault coverage refers to stuck-at fault coverage.{{Cite book , last=Williams , first=Thomas W. , title=How Should Fault Coverage Be Defined? , last2=Sunter , first2=Stephen K. , publisher=18th IEEE VLSI Test Symposium (VTS 2000), 30 April - 4 May 2000, Montreal, Canada , year=2000 , pages=325-328 , doi=10.1109/VTS.2000.10003 It is measured by sticking each pin of the hardware model at logic '0' and logic '1', respectively, and running the test vectors. If at least one of the outputs differs from what is to be expected, the fault is said to be detected. Conceptually, the total number of simulation runs is twice the numbe ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Fault (technology)
In engineering, a fault is a defect or problem in a system that causes it to fail or act abnormally. An example of this is the Windows fault screen, commonly referred to as the Blue Screen of Death (BSoD). The system actively monitors kernel-mode components. If the system determines that safe system operation is compromised, the system halts to reduce further damage. The ISO document 10303-226 defines ''fault'' as an abnormal condition or defect at the component, equipment, or sub-system level which may lead to a failure. The United States Glossary of Telecommunication Terms defines ''fault'' for telecommunications as: #An accidental condition that causes a functional unit to fail to perform its required function. See#A defect that causes a reproducible or catastrophic malfunction. A malfunction is considered reproducible if it occurs consistently under the same circumstances. See . # In Electric power, power systems, an unintentional short circuit, or partial short circuit ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Design For Test
Design for testing or design for testability (DFT) consists of integrated circuit design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be u ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Pattern Generation
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test ( full scan, synchronous sequential, or asynchronous se ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Digital Electronics
Digital electronics is a field of electronics involving the study of digital signals and the engineering of devices that use or produce them. It deals with the relationship between Binary number, binary inputs and outputs by passing electrical signals through Logic gate, logical gates, Resistor, resistors, Capacitor, capacitors, Amplifier, amplifiers, and other Electronic component, electrical components. The field of digital electronics is in contrast to analog electronics which work primarily with analog signals (signals with varying degrees of intensity as opposed to on/off two state binary signals). Despite the name, digital electronics designs include important analog design considerations. Large assemblies of logic gates, used to represent more complex ideas, are often packaged into integrated circuits. Complex devices may have simple electronic representations of Boolean logic#Digital electronic circuit design, Boolean logic functions. History The binary number system was ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Stuck-at Fault
A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be ''stuck'' at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to assure that a manufacturing defect with that type of behavior can be found with a specific test pattern. Likewise the input could be tied to a logical 0 to model the behavior of a defective circuit that cannot switch its output pin. Not all faults can be analyzed using the stuck-at fault model. Compensation for static hazards, namely branching signals, can render a circuit untestable using this model. Also, redundant circuits cannot be tested using this model, since by design there is no change in any output as a result of a single fault. Single stuck at line Single stuck line is a fault model used in digital circuits. It is used for post ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Design For Testing
Design for testing or design for testability (DFT) consists of integrated circuit design techniques that add testability features to a hardware product design. The added features make it easier to develop and apply manufacturing tests to the designed hardware. The purpose of manufacturing tests is to validate that the product hardware contains no manufacturing defects that could adversely affect the product's correct functioning. Tests are applied at several steps in the hardware manufacturing flow and, for certain products, may also be used for hardware maintenance in the customer's environment. The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered test fails. The diagnostic information can be u ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Pattern Generation
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects. The generated patterns are used to test semiconductor devices after manufacture, or to assist with determining the cause of failure (failure analysis). The effectiveness of ATPG is measured by the number of modeled defects, or fault models, detectable and by the number of generated patterns. These metrics generally indicate test quality (higher with more fault detections) and test application time (higher with more patterns). ATPG efficiency is another important consideration that is influenced by the fault model under consideration, the type of circuit under test ( full scan, synchronous sequential, or asynchronous se ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Design Automation
Electronic design automation (EDA), also referred to as electronic computer-aided design (ECAD), is a category of software tools for designing Electronics, electronic systems such as integrated circuits and printed circuit boards. The tools work together in a Design flow (EDA), design flow that chip designers use to design and analyze entire semiconductor chips. Since a modern semiconductor chip can have billions of components, EDA tools are essential for their design; this article in particular describes EDA specifically with respect to integrated circuits (ICs). History Early days The earliest electronic design automation is attributed to IBM with the documentation of its IBM 700/7000 series, 700 series computers in the 1950s. Prior to the development of EDA, integrated circuits were designed by hand and manually laid out. Some advanced shops used geometric software to generate tapes for a Gerber format, Gerber photoplotter, responsible for generating a monochromatic ex ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Fault Detection And Isolation
Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a Fault (technology), fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis of the discrepancy between the sensor readings and expected values, derived from some model. In the latter case, it is typical that a fault is said to be detected if the discrepancy or ''residual'' goes above a certain threshold. It is then the task of fault isolation to categorize the type of fault and its location in the machinery. Fault detection and isolation (FDI) techniques can be broadly classified into two categories. These include model-based FDI and signal processing based FDI. Model-based FDI In model-based FDI techniques some model of the system is used to decide about the occurrence of fault. The sys ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Design
''Electronic Design'' magazine, founded in 1952, is an electronics and electrical engineering trade magazine and website. History Hayden Publishing Company began publishing the bi-weekly magazine Electronic Design in December 1952, and was later published by InformaUSA, Inc. In 1986, Verenigde Nederlandse Uitgeverijen, purchased Hayden Publishing Inc. In June 1988, Verenigde Nederlandse Uitgeverijen, purchased ''Electronic Design'' from McGraw-Hill. In July 1989, Penton Media, purchased ''Electronic Design'', then in Hasbrouck, N.J., from Verenigde Nederlandse Uitgeverijen. In July 2007, Penton Media's OEM electronics publication, ''EE Product News'', merged with Penton Media's "Electronic Design" magazine. ''EE Product News'' was founded in 1941, as a monthly publication. In September 2016, Informa, purchased Penton Media, including ''Electronic Design''. In November 2019, Endeavor Business Media purchased ''Electronic Design'' from Informa. Content Section ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Engineering
Electronic engineering is a sub-discipline of electrical engineering that emerged in the early 20th century and is distinguished by the additional use of active components such as semiconductor devices to amplify and control electric current flow. Previously electrical engineering only used passive devices such as mechanical switches, resistors, inductors, and capacitors. It covers fields such as analog electronics, digital electronics, consumer electronics, embedded systems and power electronics. It is also involved in many related fields, for example solid-state physics, radio engineering, telecommunications, control systems, signal processing, systems engineering, computer engineering, instrumentation engineering, electric power control, photonics and robotics. The Institute of Electrical and Electronics Engineers (IEEE) is one of the most important professional bodies for electronics engineers in the US; the equivalent body in the UK is the Institution of Engin ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
