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Norio Kato
Norio Kato (Japanese: 加藤 範夫, ''Kato Norio'', March 10, 1923 – April 5, 2002) was a Japanese physicist and crystallographer. He was known for his contributions in diffraction topography and the dynamical theory of diffraction, including the validation of the Pendellösung effect and extensions to account for realistic scattering conditions. Education and career Kato was born in Shanghai, China but received his education in Japan. He studied at Seikei Gakuen, where he was taught haiku by Nakamura Kusatao, which would become one of Kato's lifelong hobby. Kato entered University of Tokyo to study physics, where he obtained a BSc degree in 1944. He went on to study under the electron microscopist Ryoji Uyeda at Nagoya University, where he received a MSc in 1946 and a doctoral degree in physics in 1954. In 1950, Kato worked at the Kobayasi Institute of Physical Research (now part of RIKEN) under Shoji Nishikawa. After his PhD, Kato continued working at the Kobayasi institu ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Diffraction Topography
Diffraction topography (short: "topography") is an imaging technique based on Bragg diffraction. Diffraction topographic images ("topographies") record the intensity profile of a beam of X-rays (or, sometimes, neutrons) diffracted by a crystal. A topography thus represents a two-dimensional spatial intensity mapping (image) of the X-rays diffracted in a specific direction, so regions which diffract substantially will appear brighter than those which do not. This is equivalent to the spatial fine structure of an Laue reflection. Topographs often reveal the irregularities in a non-ideal crystal lattice. X-ray diffraction topography is one variant of X-ray imaging, making use of diffraction contrast rather than absorption contrast which is usually used in radiography and computed tomography (CT). Topography is exploited to a lesser extent with neutrons, and is the same concept as dark field imaging in an electron microscope. Topography is used for monitoring crystal quality and ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |