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Atomic Force Acoustic Microscopy
Atomic force acoustic microscopy (AFAM) is a type of scanning probe microscopy (SPM). It is a combination of Acoustic microscopy, acoustics and Atomic Force Microscopy, atomic force microscopy. The principal difference between AFAM and other forms of SPM is the addition of a transducer at the bottom of the sample which induces longitudinal out-of-plane vibrations in the specimen. These vibrations are sensed by a cantilever and tip called a probe. The figure shown here is the clear schematic of AFAM principle here B is the magnified version of the tip and sample placed on the transducer and tip having some optical coating generally gold coating to reflect the laser light on to the photodiode. Any type of material can be measured with this microscope. In particular, Nano-scale properties such as elastic modulus, shear modulus and Poisson ratio can be measured. The frequency used sweeps from some few kHz to MHz, keeping the sine wave amplitude constant. The sine longitudinal waves ...
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Atomic Force Acoustic Microscopy (AFAM)
Atomic may refer to: * Of or relating to the atom, the smallest particle of a chemical element that retains its chemical properties * Atomic physics, the study of the atom * Atomic Age, also known as the "Atomic Era" * Atomic scale, distances comparable to the dimensions of an atom * Atom (order theory), in mathematics * Atomic (cocktail), a champagne cocktail * Atomic (magazine), ''Atomic'' (magazine), an Australian computing and technology magazine * Atomic Skis, an Austrian ski producer Music * Atomic (band), a Norwegian jazz quintet * Atomic (Lit album), ''Atomic'' (Lit album), 2001 * Atomic (Mogwai album), ''Atomic'' (Mogwai album), 2016 * ''Atomic'', an album by Rockets (band), Rockets, 1982 * Atomic (EP), ''Atomic'' (EP), by , 2013 * Atomic (song), "Atomic" (song), by Blondie, 1979 * "Atomic", a song by Tiger Army from ''Tiger Army III: Ghost Tigers Rise'' See also

* * * Atom (other) * Atomicity (database systems) * Nuclear (other) * Atomism, ph ...
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Fraunhofer Institute
The Fraunhofer Society (german: Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V., lit=Fraunhofer Society for the Advancement of Applied Research) is a German research organization with 76institutes spread throughout Germany, each focusing on different fields of applied science (as opposed to the Max Planck Society, which works primarily on basic science). With some 29,000 employees, mainly scientists and engineers, and with an annual research budget of about €2.8billion, it is the biggest organization for applied research and development services in Europe. Some basic funding for the Fraunhofer Society is provided by the state (the German public, through the federal government together with the states or ''Länder'', "owns" the Fraunhofer Society), but more than 70% of the funding is earned through contract work, either for government-sponsored projects or from industry. It is named after Joseph von Fraunhofer who, as a scientist, an engineer, and an en ...
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Scanning Acoustic Microscope
A scanning acoustic microscope (SAM) is a device which uses focused sound to investigate, measure, or image an object (a process called scanning acoustic tomography). It is commonly used in failure analysis and non-destructive evaluation. It also has applications in biological and medical research. The semiconductor industry has found the SAM useful in detecting voids, cracks, and delaminations within microelectronic packages. History The first scanning acoustic microscope (SAM), with a 50 MHz ultrasonic lens, was developed in 1974 by R. A. Lemons and C. F. Quate at the Microwave Laboratory of Stanford University. In the late seventies and early eighties acoustic microscopes operating in several GHz range were common place and a transmission SAM operating up to 500MHz had also been made by R.Gr. Maev and his students at his Laboratory of Biophysical Introscopy of the Russian Academy of Sciences. First commercial SAM ELSAM, with a broad frequency range from 100 MHz up t ...
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Scanning Probe Microscopy
Scan may refer to: Acronyms * Schedules for Clinical Assessment in Neuropsychiatry (SCAN), a psychiatric diagnostic tool developed by WHO * Shared Check Authorization Network (SCAN), a database of bad check writers and collection agency for bad checks * Space Communications and Navigation Program (SCaN) * Social Cognitive and Affective Neuroscience (journal) * Scientific content analysis (SCAN), also known as statement analysis Businesses * Scan Furniture, Washington, D.C., US chain * SCAN Health Plan, not-for-profit health care company based in Long Beach, California * Scan AB or Scan Foods UK Ltd, the Swedish and UK subsidiaries of the Finnish HKScan Oyj * Seattle Community Access Network, Seattle, Washington, US TV channel * Scan (company), a software company based in Provo, Utah, US Electronics or computer related * 3D scanning * Counter-scanning, in physical micro and nanotopography measuring instruments like scanning probe microscope * Elevator algorithm (also ...
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Scanning Near-field Ultrasound Holography
Scanning near-field ultrasound holography (SNFUH) is a method for performing nondestructive nano-scale high-resolution imaging of buried and embedded structures. SNFUH is critical for analysis of materials, structures and phenomena as they continue to shrink at the micro/nano scale. SNFUH is a type of scanning probe microscopy (SPM) technique that provides depth information as well as spatial resolution at the 10 to 100 nm scale. History Gajendra S. Shekhawat and Vinayak P. Dravid of Northwestern University (Evanston, IL, USA) developed SNFUH in 2005. Observing copper damascene structures of a void in an opaque material was made possible by this technique. Technique Scanning near-field ultrasound holography combines atomic force acoustic microscopy and ultrasonic force microscopy. Two transducers producing high frequencies are used. Usually frequency is higher than the resonant frequency of the cantilever. One transducer is placed below the sample and the other attached to ...
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Scanning Tunneling Microscopy
A scanning tunneling microscope (STM) is a type of microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1986. STM senses the surface by using an extremely sharp conducting tip that can distinguish features smaller than 0.1  nm with a 0.01 nm (10 pm) depth resolution. This means that individual atoms can routinely be imaged and manipulated. Most microscopes are built for use in ultra-high vacuum at temperatures approaching zero kelvin, but variants exist for studies in air, water and other environments, and for temperatures over 1000 °C. STM is based on the concept of quantum tunneling. When the tip is brought very near to the surface to be examined, a bias voltage applied between the two allows electrons to tunnel through the vacuum separating them. The resulting ''tunneling current'' is a function of the tip position, appl ...
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Hertz
The hertz (symbol: Hz) is the unit of frequency in the International System of Units (SI), equivalent to one event (or cycle) per second. The hertz is an SI derived unit whose expression in terms of SI base units is s−1, meaning that one hertz is the reciprocal of one second. It is named after Heinrich Rudolf Hertz (1857–1894), the first person to provide conclusive proof of the existence of electromagnetic waves. Hertz are commonly expressed in multiples: kilohertz (kHz), megahertz (MHz), gigahertz (GHz), terahertz (THz). Some of the unit's most common uses are in the description of periodic waveforms and musical tones, particularly those used in radio- and audio-related applications. It is also used to describe the clock speeds at which computers and other electronics are driven. The units are sometimes also used as a representation of the energy of a photon, via the Planck relation ''E'' = ''hν'', where ''E'' is the photon's energy, ''ν'' is its frequency ...
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Young's Modulus
Young's modulus E, the Young modulus, or the modulus of elasticity in tension or compression (i.e., negative tension), is a mechanical property that measures the tensile or compressive stiffness of a solid material when the force is applied lengthwise. It quantifies the relationship between tensile/compressive stress \sigma (force per unit area) and axial strain \varepsilon (proportional deformation) in the linear elastic region of a material and is determined using the formula: E = \frac Young's moduli are typically so large that they are expressed not in pascals but in gigapascals (GPa). Example: * Silly Putty (increasing pressure: length increases quickly, meaning tiny E) * Aluminum (increasing pressure: length increases slowly, meaning high E) Higher Young's modulus corresponds to greater (lengthwise) stiffness. Although Young's modulus is named after the 19th-century British scientist Thomas Young, the concept was developed in 1727 by Leonhard Euler. The first ...
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LabView
Laboratory Virtual Instrument Engineering Workbench (LabVIEW) is a system-design platform and development environment for a visual programming language from National Instruments. The graphical language is named "G"; not to be confused with G-code. The G dataflow language was originally developed by LabVIEW. LabVIEW is commonly used for data acquisition, instrument control, and industrial automation on a variety of operating systems (OSs), including Microsoft Windows as well as various versions of Unix, Linux, and macOS. The latest versions of LabVIEW are LabVIEW 2022 Q3 (released in July 2022) and LabVIEW NXG 5.1 (released in January 2021). NI released the free for non-commercial use LabVIEW and LabVIEW NXG Community editions on April 28th, 2020. Dataflow programming The programming paradigm used in LabVIEW, sometimes called G, is based on data availability. If there is enough data available to a subVI or function, that subVI or function will execute. Execution flow is ...
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Contact Mechanics
Contact mechanics is the study of the deformation of solids that touch each other at one or more points.Johnson, K. L, 1985, Contact mechanics, Cambridge University Press.Popov, Valentin L., 2010, ''Contact Mechanics and Friction. Physical Principles and Applications'', Springer-Verlag, 362 p., . A central distinction in contact mechanics is between stresses acting perpendicular to the contacting bodies' surfaces (known as normal stress) and frictional stresses acting tangentially between the surfaces (shear stress). Normal contact mechanics or frictionless contact mechanics focuses on normal stresses caused by applied normal forces and by the adhesion present on surfaces in close contact, even if they are clean and dry. '' Frictional contact mechanics'' emphasizes the effect of friction forces. Contact mechanics is part of mechanical engineering. The physical and mathematical formulation of the subject is built upon the mechanics of materials and continuum mechanics and ...
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Anisotropic
Anisotropy () is the property of a material which allows it to change or assume different properties in different directions, as opposed to isotropy. It can be defined as a difference, when measured along different axes, in a material's physical or mechanical properties ( absorbance, refractive index, conductivity, tensile strength, etc.). An example of anisotropy is light coming through a polarizer. Another is wood, which is easier to split along its grain than across it. Fields of interest Computer graphics In the field of computer graphics, an anisotropic surface changes in appearance as it rotates about its geometric normal, as is the case with velvet. Anisotropic filtering (AF) is a method of enhancing the image quality of textures on surfaces that are far away and steeply angled with respect to the point of view. Older techniques, such as bilinear and trilinear filtering, do not take into account the angle a surface is viewed from, which can result in ali ...
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Silicon
Silicon is a chemical element with the symbol Si and atomic number 14. It is a hard, brittle crystalline solid with a blue-grey metallic luster, and is a tetravalent metalloid and semiconductor. It is a member of group 14 in the periodic table: carbon is above it; and germanium, tin, lead, and flerovium are below it. It is relatively unreactive. Because of its high chemical affinity for oxygen, it was not until 1823 that Jöns Jakob Berzelius was first able to prepare it and characterize it in pure form. Its oxides form a family of anions known as silicates. Its melting and boiling points of 1414 °C and 3265 °C, respectively, are the second highest among all the metalloids and nonmetals, being surpassed only by boron. Silicon is the eighth most common element in the universe by mass, but very rarely occurs as the pure element in the Earth's crust. It is widely distributed in space in cosmic dusts, planetoids, and planets as various forms of silicon ...
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