|
Devices Under Test
A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibration checks. This can include a test after repair to establish that the product is performing in accordance with the original product specification. Electronics testing In the electronics industry a DUT is any electronic assembly under test. For example, cell phones coming off of an assembly line may be given a final test in the same way as the individual chips were earlier tested. Each cell phone under test is, briefly, the DUT. For circuit boards, the DUT is often connected to the test equipment using a bed of nails tester of pogo pins. Semiconductor testing In semiconductor testing, the device under test is a die on a wafer or the resulting packaged part. A connection system is used, connecting the part to automatic or manual test ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronics Industry
The electronics industry is the industry (economics), industry that produces electronic devices. It emerged in the 20th century and is today one of the largest global industries. Contemporary society uses a vast array of electronic devices that are built in factories operated by the industry, which are almost always partially automated. Electronic products are primarily assembled from metal–oxide–semiconductor (MOS) transistors and integrated circuits, the latter principally by photolithography and often on printed circuit boards. Circuit boards are assembled largely using surface-mount technology, which typically involves the automated placement of electronic parts on circuit boards using pick-and-place machines. Surface-mount technology and pick-and-place machines make it possible to assemble large numbers of circuit boards at high speed. The industry's size, the use of toxic materials, and the difficulty of recycling have led to a series of problems with electronic waste. ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Automatic Test Equipment
Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled Multimeter, digital multimeter, or a complicated system containing dozens of complex test instruments (real or simulated electronic test equipment) capable of automatically testing and diagnosing faults in sophisticated electronic packaged parts or on wafer testing, including system on chips and integrated circuits. ATE is widely used in the electronic manufacturing industry to test electronic components and systems after being fabricated. ATE is also used to test avionics and the electronic modules in automobiles. It is used in military applications like radar and wireless communication. In the semiconductor industry Semiconductor ATE, named for testing se ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electronic Engineering
Electronic engineering is a sub-discipline of electrical engineering that emerged in the early 20th century and is distinguished by the additional use of active components such as semiconductor devices to amplify and control electric current flow. Previously electrical engineering only used passive devices such as mechanical switches, resistors, inductors, and capacitors. It covers fields such as analog electronics, digital electronics, consumer electronics, embedded systems and power electronics. It is also involved in many related fields, for example solid-state physics, radio engineering, telecommunications, control systems, signal processing, systems engineering, computer engineering, instrumentation engineering, electric power control, photonics and robotics. The Institute of Electrical and Electronics Engineers (IEEE) is one of the most important professional bodies for electronics engineers in the US; the equivalent body in the UK is the Institution of Engin ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Semiconductor Device Fabrication
Semiconductor device fabrication is the process used to manufacture semiconductor devices, typically integrated circuits (ICs) such as microprocessors, microcontrollers, and memories (such as Random-access memory, RAM and flash memory). It is a multiple-step Photolithography, photolithographic and physico-chemical process (with steps such as thermal oxidation, thin-film deposition, ion-implantation, etching) during which electronic circuits are gradually created on a wafer (electronics), wafer, typically made of pure single-crystal semiconducting material. Silicon is almost always used, but various compound semiconductors are used for specialized applications. This article focuses on the manufacture of integrated circuits, however steps such as etching and photolithography can be used to manufacture other devices such as LCD and OLED displays. The fabrication process is performed in highly specialized semiconductor fabrication plants, also called foundries or "fabs", with the cen ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Test Oracle
In software testing, a test oracle (or just oracle) is a provider of information that describes correct output based on the input of a test case. Testing with an oracle involves comparing actual results of the system under test (SUT) with the expected results as provided by the oracle. The term "test oracle" was first introduced in a paper by William E. Howden. Additional work on different kinds of oracles was explored by Elaine Weyuker. An oracle can operate separately from the SUT; accessed at test runtime, or it can be used before a test is run with expected results encoded into the test logic.Jalote, Pankaj; ''An Integrated Approach to Software Engineering'', Springer/Birkhäuser, 2005, However, method postconditions are part of the SUT, as automated oracles in design by contract models. Determining the correct output for a given input (and a set of program or system states) is known as the ''oracle problem'' or ''test oracle problem'', which some consider a relatively ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Test Bench
A test bench or testing workbench is an environment used to verify the correctness or soundness of a design or model. The term has its roots in the testing of electronic devices, where an engineer would sit at a lab bench with tools for measurement and manipulation, such as oscilloscopes, multimeters, soldering irons, wire cutters, and so on, and manually verify the correctness of the device under test (DUT). In the context of software or firmware or hardware engineering, a test bench is an environment in which the product under development is tested with the aid of software and hardware tools. The software may need to be modified slightly in some cases to work with the test bench but careful coding can ensure that the changes can be undone easily and without introducing bugs. The term "test bench" is used in digital design with a hardware description language to describe the test code, which instantiates the DUT and runs the test. An additional meaning for "test bench" is an ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
System Under Test
System under test (SUT) refers to a system that is being tested for correct operation. According to ISTQB it is the test object. From a unit testing perspective, the system under test represents all of the classes in a test that are not predefined pieces of code like stubs or even mocks. Each one of this can have its own configuration (a name and a version), making it scalable for a series of tests to get more and more precise, according to the quantity of quality of the system in test. See also * Device under test A device under test (DUT), also known as equipment under test (EUT) and unit under test (UUT), is a manufactured product undergoing testing, either at first manufacture or later during its life cycle as part of ongoing functional testing and calibr ... * Test harness References External links Test Procedure for §170.314(c) Clinical quality measures Software quality Systems engineering {{Software-type-stub ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Product Testing
File:Consumer Reports - product testing - electric light longevity and brightness testing.tif, Testing electric light longevity and brightness testing File:Consumer Reports - product testing - television testing laboratory.tif, Television testing laboratory File:Consumer Reports - product testing - headphones in anechoic chamber.tif, Product testing headphones in an anechoic chamber Product testing, also called consumer testing or comparative testing, is a process of measuring the properties or performance of products. The theory is that since the advent of mass production, manufacturers produce branded products which they assert and advertise to be identical within some technical standard. Product testing seeks to ensure that consumers can understand what products will do for them and which products are the best value. Product testing is a strategy to increase consumer protection by checking the claims made during marketing strategy, marketing strategies such as advertising, w ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
DUT Board
A probe card (commonly referred to as a DUT board) is used in automated integrated circuit testing. It is an interface between an electronic test system and a semiconductor wafer. Use and manufacture A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE . Its purpose is to provide an electrical path between the test system and the circuits on the wafer, thereby permitting the testing and validation of the circuits at the wafer level, usually before they are diced and packaged. It normally comprises a PCB and some form of contact elements, usually metallic. A semiconductor manufacturer will typically require a new probe card for each new device wafer and for device shrinks (when the manufacturer reduces the size of the d ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Zero Insertion Force
Zero insertion force (ZIF) is a type of IC socket or electrical connector that requires very little (but not literally zero) force for insertion. With a ZIF socket, before the IC is inserted, a lever or slider on the side of the socket is moved, pushing all the sprung contacts apart so that the IC can be inserted with very little force - generally the weight of the IC itself is sufficient and no external downward force is required. The lever is then moved back, allowing the contacts to close and grip the pins of the IC. ZIF sockets are much more expensive than standard IC sockets and also tend to take up a larger board area due to the space taken up by the lever mechanism. Typically, they are only used when there is a good reason to do so. Design A normal integrated circuit (IC) socket requires the IC to be pushed into sprung contacts which then grip by friction. For an IC with hundreds of pins, the total insertion force can be very large (hundreds of newtons), leading ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Printed Circuit Board
A printed circuit board (PCB), also called printed wiring board (PWB), is a Lamination, laminated sandwich structure of electrical conduction, conductive and Insulator (electricity), insulating layers, each with a pattern of traces, planes and other features (similar to wires on a flat surface) Chemical milling, etched from one or more sheet layers of copper laminated onto or between sheet layers of a non-conductive substrate. PCBs are used to connect or Electrical wiring, "wire" Electronic component, components to one another in an electronic circuit. Electrical components may be fixed to conductive pads on the outer layers, generally by soldering, which both electrically connects and mechanically fastens the components to the board. Another manufacturing process adds Via (electronics), vias, metal-lined drilled holes that enable electrical interconnections between conductive layers, to boards with more than a single side. Printed circuit boards are used in nearly all e ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Semiconductor Curve Tracer
A curve tracer is a specialised piece of electronic test equipment used to analyze the characteristics of discrete electronic components, such as diodes, transistors, thyristors, and vacuum tubes. The device contains voltage and current sources that can be used to stimulate the device under test (DUT). Operation The function is to apply a swept (automatically continuously varying with time) voltage to two terminals of the device under test and measure the amount of current that the device permits to flow at each voltage. This so-called I–V (current versus voltage) data is either directly displayed on an oscilloscope screen, or recorded to a data file for later processing and graphing with a computer. Configuration includes the maximum voltage applied, the polarity of the voltage applied (including the automatic application of both positive and negative polarities), and the resistance inserted in series with the device. The main terminal voltage can often be swept up to several ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
