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Direct Electron Detector
There are a variety of technologies available for detecting and recording the images, Electron diffraction, diffraction patterns, and Electron energy loss spectroscopy, electron energy loss spectra produced using transmission electron microscopy (TEM). Traditional detection techniques Traditionally, TEM images or diffraction patterns could be observed using a fluorescent viewing screen, consisting of powdered ZnS or ZnS/CdS, which is excited by the electron beam via cathodoluminescence. Once the microscopist could see a suitable image on their viewing screen, images could then be recorded using photographic film. For electron microscopes, film typically consisted of a gelatin and silver halide emulsion layer on a plastic support base. The silver halide would be converted to silver upon exposure to the electron beam, and the film could then be chemically developed to form an image, which could be digitized for analysis using a film scanner. In modern TEMs, film has largely been repla ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electron Diffraction
Electron diffraction is a generic term for phenomena associated with changes in the direction of electron beams due to elastic interactions with atoms. It occurs due to elastic scattering, when there is no change in the energy of the electrons. The negatively charged electrons are scattered due to Coulomb forces when they interact with both the positively charged atomic core and the negatively charged electrons around the atoms. The resulting map of the directions of the electrons far from the sample is called a diffraction pattern, see for instance Figure 1. Beyond patterns showing the directions of electrons, electron diffraction also plays a major role in the contrast of images in electron microscopes. This article provides an overview of electron diffraction and electron diffraction patterns, collective referred to by the generic name electron diffraction. This includes aspects of how in a general way electrons can act as waves, and diffract and interact with matter. It a ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
White Noise
In signal processing, white noise is a random signal having equal intensity at different frequencies, giving it a constant power spectral density. The term is used with this or similar meanings in many scientific and technical disciplines, including physics, acoustical engineering, telecommunications, and statistical forecasting. White noise refers to a statistical model for signals and signal sources, not to any specific signal. White noise draws its name from white light, although light that appears white generally does not have a flat power spectral density over the visible band. In discrete time, white noise is a discrete signal whose samples are regarded as a sequence of serially uncorrelated random variables with zero mean and finite variance; a single realization of white noise is a random shock. In some contexts, it is also required that the samples be independent and have identical probability distribution (in other words independent and identically distribu ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
4D Scanning Transmission Electron Microscopy (4D STEM)
4D scanning transmission electron microscopy (4D STEM) is a subset of scanning transmission electron microscopy (STEM) which utilizes a pixelated electron detector to capture a convergent beam electron diffraction (CBED) pattern at each scan location. This technique captures a 2 dimensional reciprocal space image associated with each scan point as the beam rasters across a 2 dimensional region in real space, hence the name 4D STEM. Its development was enabled by evolution in STEM detectors and improvements in computational power. The technique has applications in visual diffraction imaging, phase orientation and strain mapping, phase contrast analysis, among others. The name 4D STEM is common in literature, however it is known by other names: 4D STEM EELS, ND STEM (N- since the number of dimensions could be higher than 4), position resolved diffraction (PRD), spatial resolved diffractometry, momentum-resolved STEM, "nanobeam precision electron diffraction", scanning electron nano di ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Photomultiplier
A photomultiplier is a device that converts incident photons into an electrical signal. Kinds of photomultiplier include: * Photomultiplier tube, a vacuum tube converting incident photons into an electric signal. Photomultiplier tubes (PMTs for short) are members of the class of vacuum tubes, and more specifically vacuum phototubes, which are extremely sensitive detectors of light in the ultraviolet, visible, and near-infrared ranges of the electromagnetic spectrum. ** Magnetic photomultiplier, developed by the Soviets in the 1930s. ** Electrostatic photomultiplier, a kind of photomultiplier tube demonstrated by Jan Rajchman of RCA Laboratories in Princeton, NJ in the late 1930s which became the standard for all future commercial photomultipliers. The first mass-produced photomultiplier, the Type 931, was of this design and is still commercially produced today. * Silicon photomultiplier, a solid-state device converting incident photons into an electric signal. Silicon photomul ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Annular Dark-field Imaging
Annular dark-field imaging is a method of mapping samples in a scanning transmission electron microscope (STEM). These images are formed by collecting scattered electrons with an annular dark-field detector. Conventional TEM dark-field imaging uses an objective aperture to only collect scattered electrons that pass through. In contrast, STEM dark-field imaging does not use an aperture to differentiate the scattered electrons from the main beam, but uses an annular detector to collect only the scattered electrons. Consequently, the contrast mechanisms are different between conventional dark field imaging and the STEM dark field. An annular dark field detector collects electrons from an annulus around the beam, sampling far more scattered electrons than can pass through an objective aperture. This gives an advantage in terms of signal collection efficiency and allows the main beam to pass to an electron energy loss spectroscopy (EELS) detector, allowing both types of measurem ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Transmission Electron Microscopy
A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused to a fine spot (with the typical spot size 0.05 – 0.2 nm) which is then scanned over the sample in a raster illumination system constructed so that the sample is illuminated at each point with the beam parallel to the optical axis. The rastering of the beam across the sample makes STEM suitable for analytical techniques such as Z-contrast annular dark-field imaging, and spectroscopic mapping by energy-dispersive X-ray spectroscopy, energy dispersive X-ray (EDX) spectroscopy, or electron energy loss spectroscopy (EELS). These signals can be obtained simultaneously, allowing direct correlation of images and spectroscopic data. A ty ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Transmission Electron Microscopy Srtio3 Compare Adf Abf
Scan, SCAN or Scanning may refer to: Science and technology Computing and electronics * Graham scan, an algorithm for finding the convex hull of a set of points in the plane * 3D scanning, of a real-world object or environment to collect three dimensional data * Counter-scanning, in physical micro and nanotopography measuring instruments like scanning probe microscope * Elevator algorithm or SCAN, a disk scheduling algorithm * Image scanning, an optical scan of images, printed text, handwriting or an object * Optical character recognition, optical recognition of printed text or printed sheet music * Port scanner, in computer networking * Prefix sum, an operation on lists that is also known as the scan operator * Raster scan, the rectangular pattern of image capture and reconstruction in television * Scan chain, a type of manufacturing test used with integrated circuits * Scan line, one line in a raster scanning pattern * Screen reading, on computers to quickly locate text element ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Active Pixel Sensor
An active-pixel sensor (APS) is an image sensor, which was invented by Peter J.W. Noble in 1968, where each pixel sensor unit cell has a photodetector (typically a pinned photodiode) and one or more active transistors. In a metal–oxide–semiconductor (MOS) active-pixel sensor, MOS field-effect transistors (MOSFETs) are used as amplifiers. There are different types of APS, including the early NMOS APS and the now much more common complementary MOS (CMOS) APS, also known as the CMOS sensor. CMOS sensors are used in digital camera technologies such as cell phone cameras, web cameras, most modern digital pocket cameras, most digital single-lens reflex cameras (DSLRs), mirrorless interchangeable-lens cameras (MILCs), and lensless imaging for, e.g., blood cells. CMOS sensors emerged as an alternative to charge-coupled device (CCD) image sensors and eventually outsold them by the mid-2000s. The term ''active pixel sensor'' is also used to refer to the individual pixel sensor its ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Hybrid Pixel Detector
Hybrid pixel detectors are a type of ionizing radiation detector consisting of an array of diodes based on semiconductor technology and their associated electronics. The term “hybrid” stems from the fact that the two main elements from which these devices are built, the semiconductor sensor and the readout chip (also known as application-specific integrated circuit or ASIC), are manufactured independently and later electrically coupled by means of a bump-bonding process. Ionizing particles are detected as they produce electron-hole pairs through their interaction with the sensor element, usually made of doped silicon or cadmium telluride. The readout ASIC is segmented into pixels containing the necessary electronics to amplify and measure the electrical signals induced by the incoming particles in the sensor layer. Hybrid pixel detectors made to operate in single-photon mode are known as Hybrid Photon Counting Detectors (HPCDs). These detectors are designed to count the number ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Complementary Metal Oxide Semiconductor
Complementary metal–oxide–semiconductor (CMOS, pronounced "sea-moss ", , ) is a type of MOSFET, metal–oxide–semiconductor field-effect transistor (MOSFET) semiconductor device fabrication, fabrication process that uses complementary and symmetrical pairs of p-type semiconductor, p-type and n-type semiconductor, n-type MOSFETs for logic functions. CMOS technology is used for constructing integrated circuit (IC) chips, including microprocessors, microcontrollers, memory chips (including Nonvolatile BIOS memory, CMOS BIOS), and other digital logic circuits. CMOS technology is also used for analog circuits such as image sensors (CMOS sensors), data conversion, data converters, RF circuits (RF CMOS), and highly integrated transceivers for many types of communication. In 1948, Bardeen and Brattain patented an insulated-gate transistor (IGFET) with an inversion layer. Bardeen's concept forms the basis of CMOS technology today. The CMOS process was presented by Fairchild Semico ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
