Scanning Hall Probe Microscopy
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Scanning Hall probe microscope (SHPM) is a variety of a
scanning probe microscope Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging ...
which incorporates accurate sample approach and positioning of the
scanning tunnelling microscope A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in ...
with a
semiconductor A semiconductor is a material with electrical conductivity between that of a conductor and an insulator. Its conductivity can be modified by adding impurities (" doping") to its crystal structure. When two regions with different doping level ...
Hall sensor In architecture, a hall is a relatively large space enclosed by a roof and walls. In the Iron Age and the Early Middle Ages in northern Europe, a mead hall was where a lord and his retainers ate and also slept. Later in the Middle Ages, the gre ...
. Developed in 1996 by Oral,
Bending In applied mechanics, bending (also known as flexure) characterizes the behavior of a slender structural element subjected to an external Structural load, load applied perpendicularly to a longitudinal axis of the element. The structural eleme ...
and Henini, SHPM allows mapping the magnetic induction associated with a sample. Current state of the art SHPM systems utilize
2D electron gas A two-dimensional electron gas (2DEG) is a scientific model in solid-state physics. It is an electron gas that is free to move in two dimensions, but tightly confined in the third. This tight confinement leads to quantized energy levels for motio ...
materials (e.g.
GaAs Gallium arsenide (GaAs) is a III-V direct band gap semiconductor with a zinc blende crystal structure. Gallium arsenide is used in the manufacture of devices such as microwave frequency integrated circuits, monolithic microwave integrated circui ...
/AlGaAs) to provide high spatial resolution (~300 nm) imaging with high magnetic field sensitivity. Unlike the
magnetic force microscope Magnetic force microscopy (MFM) is a variety of atomic force microscopy, in which a sharp magnetized tip scans a magnetic sample; the tip-sample magnetic interactions are detected and used to reconstruct the magnetic structure of the sample sur ...
the SHPM provides direct quantitative information on the magnetic state of a material. The SHPM can also image magnetic induction under applied fields up to ~1 tesla and over a wide range of temperatures (millikelvins to 300 K). The SHPM can be used to image many types of magnetic structures such as thin films, permanent magnets, MEMS structures, current carrying traces on PCBs, permalloy disks, and recording media


Advantages to other magnetic raster scanning methods

SHPM is a superior magnetic imaging technique due to many reasons. Although MFM provides higher spatial resolution (~30 nm) imaging, unlike the MFM technique, the Hall probe exerts negligible force on the underlying magnetic structure and is noninvasive. Unlike the magnetic decoration technique, the same area can be scanned over and over again. The magnetic field caused by hall probe is so minimal it has a negligible effect on sample it is measuring. The sample does not need to be an electrical conductor, unless using STM for height control. The measurement can be performed from 5 – 500 K in ultra high vacuum (UHV) and is nondestructive to the crystal lattice or structure. Tests requires no special surface preparation or coating. The detectable magnetic field sensitivity, is approximately 0.1 uT – 10 T. SHPM can be combined with other scanning methods such as STM.


Limitations

There are some shortcomings or difficulties when working with an SHPM. High resolution scans become difficult due to the thermal noise of extremely small hall probes. There is a minimum scanning height distance due to the construction of the hall probe. (This is especially significant with 2DEG semi-conductor probes due to their multi-layer design). The scanning (lift) height affects obtained image. Scanning large areas takes a significant amount of time. There is a relatively short practical scanning range (order of 1000s micrometer) along any direction. The housing is important to shield electromagnetic noise (Faraday cage), acoustic noise (anti-vibrating tables), air flow (air isolation cupboard), and static charge on the sample (ionizing units).


References

{{SPM2 Scanning probe microscopy