Failure analysis is the process of collecting and analyzing data to determine the cause of a
failure
Failure is the state or condition of not meeting a desirable or intended objective, and may be viewed as the opposite of success. The criteria for failure depends on context, and may be relative to a particular observer or belief system. One ...
, often with the goal of determining corrective actions or liability.
According to Bloch and Geitner, ”machinery failures reveal a reaction chain of cause and effect… usually a deficiency commonly referred to as the symptom…”. failure analysis can save money, lives, and resources if done correctly and acted upon. It is an important discipline in many branches of manufacturing industry, such as the electronics industry, where it is a vital tool used in the development of new products and for the improvement of existing products. The failure analysis process relies on collecting failed components for subsequent examination of the cause or causes of failure using a wide array of methods, especially
microscopy
Microscopy is the technical field of using microscopes to view objects and areas of objects that cannot be seen with the naked eye (objects that are not within the resolution range of the normal eye). There are three well-known branches of mi ...
and
spectroscopy
Spectroscopy is the field of study that measures and interprets the electromagnetic spectra that result from the interaction between electromagnetic radiation and matter as a function of the wavelength or frequency of the radiation. Matter ...
.
Nondestructive testing
Nondestructive testing (NDT) is any of a wide group of analysis techniques used in science and technology industry to evaluate the properties of a material, component or system without causing damage.
The terms nondestructive examination (NDE), n ...
(NDT) methods (such as
industrial computed tomography scanning) are valuable because the failed products are unaffected by analysis, so inspection sometimes starts using these methods.
Forensic investigation
Forensic
Forensic science, also known as criminalistics, is the application of science to criminal and civil laws, mainly—on the criminal side—during criminal investigation, as governed by the legal standards of admissible evidence and crimin ...
inquiry into the failed process or product is the starting point of failure analysis. Such inquiry is conducted using scientific analytical methods such as electrical and mechanical measurements, or by analyzing failure data such as product reject reports or examples of previous failures of the same kind. The methods of
forensic engineering
Forensic engineering has been defined as ''"the investigation of failures - ranging from serviceability to catastrophic - which may lead to legal activity, including both civil and criminal".'' It includes the investigation of materials, produc ...
are especially valuable in tracing product defects and flaws. They may include
fatigue
Fatigue describes a state of tiredness that does not resolve with rest or sleep. In general usage, fatigue is synonymous with extreme tiredness or exhaustion that normally follows prolonged physical or mental activity. When it does not resolve ...
cracks,
brittle cracks produced by
stress corrosion cracking
Stress corrosion cracking (SCC) is the growth of crack formation in a corrosive environment. It can lead to unexpected and sudden failure of normally ductile metal alloys subjected to a tensile stress, especially at elevated temperature. SCC ...
or
environmental stress cracking for example. Witness statements can be valuable for reconstructing the likely sequence of events and hence the chain of cause and effect. Human factors can also be assessed when the cause of the failure is determined. There are several useful methods to prevent product failures occurring in the first place, including
failure mode and effects analysis (FMEA) and
fault tree analysis (FTA), methods which can be used during
prototyping to analyze failures before a product is marketed.
Several of the techniques used in failure analysis are also used in the analysis of
no fault found (NFF) which is a term used in the field of maintenance to describe a situation where an originally reported mode of failure can't be duplicated by the evaluating technician and therefore the potential defect can't be fixed.
NFF can be attributed to oxidation, defective connections of electrical components, temporary shorts or opens in the circuits, software bugs, temporary environmental factors, but also to the operator error. A large number of devices that are reported as NFF during the first troubleshooting session often return to the failure analysis lab with the same NFF symptoms or a permanent mode of failure.
The term failure analysis also applies to other fields such as business management and military strategy.
Failure analysis engineers
A failure analysis engineer often plays a lead role in the analysis of failures, whether a component or product fails in service or if failure occurs in manufacturing or during production processing. In any case, one must determine the cause of failure to prevent future occurrence, and/or to improve the performance of the device, component or structure. Structural Engineers and Mechanical Engineers are very common for the job. More specific majors can also get into the position such as materials engineers. Specializing in metallurgy and chemistry is always useful along with properties and strengths of materials. Someone could be hired for different reasons, whether it be to further prevent or liability issues. The median salary of a failure analysis engineer, an engineer with experience in the field, is $81,647.
A failure analysis engineer requires a good amount of communication and ability to work with others. Usually, the person hired has a bachelor's degree in engineering, but there are certifications that can be acquired.
Methods of analysis
The failure analysis of many different products involves the use of the following tools and techniques:
Microscopes
*
Optical microscope
The optical microscope, also referred to as a light microscope, is a type of microscope that commonly uses visible light and a system of lenses to generate magnified images of small objects. Optical microscopes are the oldest design of micros ...
*
Scanning acoustic microscope
A scanning acoustic microscope (SAM) is a device which uses focused sound to investigate, measure, or image an object (a process called scanning acoustic tomography). It is commonly used in failure analysis and non-destructive evaluation. It als ...
(SAM)
*
Scanning electron microscope (SEM)
*
Atomic force microscope (AFM)
*
Stereomicroscope
*
Photon emission microscopy (PEM)
*
X-ray microscope
*
Infra-red microscope
*
Scanning SQUID microscope
*
USB microscope
Sample preparation
* Jet-etcher
*
Plasma etcher
Plasma etching is a form of plasma processing used to fabricate integrated circuits. It involves a high-speed stream of glow discharge (plasma) of an appropriate gas mixture being shot (in pulses) at a sample. The plasma source, known as etch speci ...
*
Metallography
* Back side thinning tools
** Mechanical back-side thinning
** Laser chemical back-side etching
Spectroscopic analysis
*
Transmission line
In electrical engineering, a transmission line is a specialized cable or other structure designed to conduct electromagnetic waves in a contained manner. The term applies when the conductors are long enough that the wave nature of the transmi ...
pulse spectroscopy (TLPS)
*
Auger electron spectroscopy
A Hanford scientist uses an Auger electron spectrometer to determine the elemental composition of surfaces.
Auger electron spectroscopy (AES; pronounced in French) is a common analytical technique used specifically in the study of surfaces and, ...
*
Deep-level transient spectroscopy Deep-level transient spectroscopy (DLTS) is an experimental tool for studying electrically active defects (known as charge carrier traps) in semiconductors. DLTS establishes fundamental defect parameters and measures their concentration in the mater ...
(DLTS)
Device modification
*
Focused ion beam etching (FIB)
Surface analysis
*
Dye penetrant inspection
* Other
Surface analysis tools
Electron microscopy
*
Scanning electron microscope (SEM)
**
Electron beam induced current (EBIC) in SEM
**
Charge-induced voltage alteration (CIVA) in SEM
**
Voltage contrast
Voltage, also known as electric pressure, electric tension, or (electric) potential difference, is the difference in electric potential between two points. In a static electric field, it corresponds to the work needed per unit of charge to ...
in SEM
**
Electron backscatter diffraction
Electron backscatter diffraction (EBSD) is a scanning electron microscope–based microstructural-crystallographic characterization technique commonly used in the study of crystalline or polycrystalline materials. The technique can provide info ...
(EBSD) in SEM
**
Energy-dispersive X-ray spectroscopy (EDS) in SEM
*
Transmission electron microscope
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a gr ...
(TEM)
* Computer-controlled scanning electron microscope (CCSEM)
Laser signal injection microscopy (LSIM)
* Photo carrier stimulation
** Static
***
Optical beam induced current Optical beam induced current (OBIC) is a semiconductor analysis technique performed using laser signal injection. The technique
uses a scanning laser beam to create electron–hole pairs in a semiconductor sample. This induces a current which may b ...
(OBIC)
***
Light-induced voltage alteration
Light-induced voltage alteration (LIVA) is a semiconductor analysis technique that uses a laser or infrared light source to induce voltage changes in a device while scanning the beam of light across its surface. The technique relies upon the ge ...
(LIVA)
** Dynamic
***
Laser-assisted device alteration Laser-assisted device alteration (LADA) is a laser-based timing analysis technique used in the failure analysis of semiconductor devices. The laser is used to temporarily alter the operating characteristics of transistors on the device.
Theory of o ...
(LADA)
*
Thermal laser stimulation
Thermal laser stimulation represents a class of defect imaging techniques which employ a laser to produce a thermal variation in a semiconductor device. This technique may be used for semiconductor failure analysis. There are four techniques associ ...
(TLS)
** Static
***
Optical-beam-induced resistance change (OBIRCH)
***
Thermally induced voltage alteration (TIVA)
***
External induced voltage alteration (XIVA)
***
Seebeck effect imaging (SEI)
** Dynamic
*** Soft defect localization (SDL)
Semiconductor probing
*
Mechanical probe station
A mechanical probe station is used to physically acquire signals from the internal nodes of a semiconductor device. The probe station utilizes manipulators which allow the precise positioning of thin needles on the surface of a semiconductor device ...
*
Electron beam prober The electron beam prober (e-beam prober) is a specialized adaption of a standard scanning electron microscope (SEM) that is used for semiconductor failure analysis. While a conventional SEM may be operated in a voltage range of 10–30 keV, th ...
*
Laser voltage prober The laser voltage probe (LVP) is a laser-based voltage and timing waveform acquisition system which is used to perform failure analysis on flip-chip integrated circuits. The device to be analyzed is de-encapsulated in order to expose the silicon sur ...
*
Time-resolved photon emission prober (TRPE)
*
Nanoprobing
Software-based fault location techniques
*
CAD Navigation
*
Automatic test pattern generation (ATPG)
*
Chip bonder Chromatin immunoprecipitation (ChIP) is a type of immunoprecipitation experimental technique used to investigate the interaction between proteins and DNA in the cell. It aims to determine whether specific proteins are associated with specific geno ...
Case Studies
Two Shear Key Rods failed on the Bay Bridge
People on the Case
Mr. Brahimi is an American Bridge Fluor consultant and has a Masters in materials engineering.
Mr. Aguilar is the Branch Chief for Caltrans Structural Materials Testing Branch with 30 years’ experience as an engineer.
Mr. Christensen who is a Caltrans consultant with 32 years of experience with metallurgy and failure analysis.
Steps
Visual Observation which is non-destructive examination. This revealed sign of brittleness with no permanent plastic deformation before it broke. Cracks were shown which were the final breaking point of the shear key rods. The engineers suspected hydrogen was involved in producing the cracks.
Scanning Electron Microscopy which is the scanning of the cracked surfaces under high magnification to get a better understanding of the fracture. The full fracture happened after the rod couldn’t hold under load when the crack reached a critical size.
Micro Structural Examination where cross-sections were examined to reveal more information about interworking bonds of the metal.
Hardness Testing using two strategies, the Rockwell C Hardness and the Knoop Microhardness which reveals that it was not heat treated correctly.
Tensile Test tells the engineer the yield strength, tensile strength, and elongation was sufficient to pass the requirements. Multiple pieces were taken and performed by Anamet Inc.
Charpy V-Notch Impact Test shows the toughness of the steel by taking different samples of the rod and done by Anamet Inc.
Chemical Analysis was the Final Test also done by Anamet Inc. which met the requirements for that steel.
Conclusion of the Case Study
The rods failed from hydrogen embrittlement which was susceptible to the hydrogen from the high tensile load and the hydrogen already in the material. The rods did not fail because they did not meet the requirements for strength in these rods. While they met requirements, the structure was inhomogeneous which caused different strengths and low toughness.
This study shows a couple of the many ways failure analysis can be done. It always starts with a nondestructive form of observation, like a crime scene. Then pieces of the material are taken from the original piece which are used in different observations. Then destructive testing is done to find toughness and properties of the material to find exactly what went wrong.
Failure of failure analysis
The Oakland Nimitz Freeway was a bridge that collapsed during an earthquake even after the program to strengthen the bridge. Different engineers were asked their take on the situation. Some did not blame the program or the department, like James Rogers who said that in an earthquake there is “a good chance the Embarcadero would do the same thing the Nimitz did.”
Others said more prevention could have been done. Priestly said that “neither of the department’s projects to strengthen roadways addressed the problems of weakness…” in the bridge's joints. Some experts agreed that more could have been done to prevent this disaster. The program is under fire for making “the failure more serious”.
From a design engineer's POV
A product needs to be able to work even in the hardest of scenarios. This is very important on products made for expensive builds such as buildings or aircraft. If these parts fail, they can cause serious damage and/or safety problems. A product starts to be designed "...to minimize the hazards associated with this "worst case scenario." Discerning the worst case scenario requires a complete understanding of the product, its loading and its service environment. Prior to the product entering service, a prototype will often undergo laboratory testing which proves the product withstands the worst case scenario as expected."
Some of the tests done on jet engines today are very intensive checking if the engine can withstand:
* ingestion of debris, dust, sand, etc.;
* ingestion of hail, snow, ice, etc.;
* ingestion of excessive amounts of water.
These tests must be harder than what the product will experience in use. The engines are pushed to the max in order to ensure that the product will function the way it should no matter the condition. Failure analysis on both sides is about the prevention of damage and maintaining safety.
See also
*
Metallurgical failure analysis
Metallurgical failure analysis is the process to determine the mechanism that has caused a metal component to fail. It can identify the cause of failure, providing insight into the root cause and potential solutions to prevent similar failures in ...
*
Failure cause
*
Acronyms in microscopy
*
List of materials analysis methods
This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.
Symbols
* μSR – see muon spin spectroscopy
* χ – see magnetic susceptibility
A
* AAS – Atomic absorption spe ...
*
List of materials-testing resources
*
Failure mode and effects analysis (FMEA)
*
Failure rate
Failure rate is the frequency with which an engineered system or component fails, expressed in failures per unit of time. It is usually denoted by the Greek letter λ (lambda) and is often used in reliability engineering.
The failure rate of a ...
*
Forensic electrical engineering
*
Forensic engineering
Forensic engineering has been defined as ''"the investigation of failures - ranging from serviceability to catastrophic - which may lead to legal activity, including both civil and criminal".'' It includes the investigation of materials, produc ...
*
Forensic materials engineering
*
Forensic polymer engineering
*
Forensic science
*
Microscope
A microscope () is a laboratory instrument used to examine objects that are too small to be seen by the naked eye. Microscopy is the science of investigating small objects and structures using a microscope. Microscopic means being invisibl ...
*
Material science
*
Sample preparation equipment
*
Accident analysis
Accident analysis is carried out in order to determine the cause or causes of an accident (that can result in single or multiple outcomes) so as to prevent further accidents of a similar kind. It is part of ''accident investigation or incident in ...
*
Characterization (materials science)
Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scie ...
* Failure reporting, analysis and corrective action systems (failure data collection)
References
; Bibliography
Article on the subject at IEEE archive Finite Element Implementation of Advanced Failure Criteria for Composites
Further reading
* Martin, Perry L., ''Electronic Failure Analysis Handbook'', McGraw-Hill Professional; 1st edition (February 28, 1999) .
* ''Microelectronics Failure Analysis'', ASM International; Fifth Edition (2004)
* Lukowsky, D., ''Failure Analysis of Wood and Wood-Based Products'', McGraw-Hill Education; 1st edition (2015) {{ISBN, 978-0-07-183937-2.
Engineering failures
Reliability engineering
Semiconductor analysis
Maintenance