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Electron Backscatter Diffraction
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the Crystallography, crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a Phosphorescence, phosphorescent screen, a compact lens and a low-light Charge-coupled device, camera. In the microscope an incident beam of electrons hits a tilted sample. As backscattered electrons leave the sample, they interact with the atoms and are both elastically Electron diffraction, diffracted and lose energy, leaving the sample at various scattering angles before reaching the phosphor screen forming Kikuchi lines (physics), Kikuchi patterns (EBSPs). The EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. They can be indexed to provide information about the material's grain Crystal structure, structure, grain Electron crystallogr ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Phase-change Material
A phase-change material (PCM) is a substance which releases/absorbs sufficient energy at phase transition to provide useful heat or cooling. Generally the transition will be from one of the first two fundamental states of matter - solid and liquid - to the other. The phase transition may also be between non-classical states of matter, such as the conformity of crystals, where the material goes from conforming to one crystalline structure to conforming to another, which may be a higher or lower energy state. The energy released/absorbed by phase transition from solid to liquid, or vice versa, the heat of fusion is generally much higher than the sensible heat. Ice, for example, requires 333.55 J/g to melt, but then water will rise one degree further with the addition of just 4.18 J/g. Water/ice is therefore a very useful phase change material and has been used to store winter cold to cool buildings in summer since at least the time of the Achaemenid Empire. By melting and sol ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Transmission Electron Microscopy
Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a detector such as a scintillator attached to a charge-coupled device or a direct electron detector. Transmission electron microscopes are capable of imaging at a significantly higher resolution than light microscopes, owing to the smaller de Broglie wavelength of electrons. This enables the instrument to capture fine detail—even as small as a single column of atoms, which is thousands of times smaller than a resolvable object seen in a light microscope. Transmission electron micr ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Shoji Nishikawa
Shōji Nishikawa (Japanese: 西川 正治, ''Nishikawa Shōji'', 5 December 1884 – 5 January 1952) was a Japanese physicist and a founding father of crystallography in Japan. Education and career Nishikawa was born in 1884 in Hachiōji, Tokyo Prefecture, as the son of an important silk dealer. He grew up in Tokyo and later studied at the Faculty of Science at the Imperial University of Tokyo (now University of Tokyo). His PhD in physics was supervised by Suekichi Kinoshita, with an initial focus on radioactivity. During this time, Nishikawa was inspired by Torahiko Terada to turn his interest turned to crystallography, which was experiencing a worldwide boom with the then new method of X-ray diffraction for structural analysis. The first publications of Nishikawa came out between 1913 and 1915, at a time when the British Nobel Prize winners in physics William Henry Bragg and William Lawrence Bragg were doing groundbreaking pioneering work in this field. Between 1916 and 1919, ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Seishi Kikuchi
was a Japanese physicist, known for his explanation of the Kikuchi lines that show up in diffraction patterns of diffusely scattered electrons. Kikuchi's research was recorded in the official Nobel Prize selection meeting minutes of the 1930s. Biography Seishi Kikuchi was born and grew up in Tokyo. He graduated in 1926 from Tokyo Imperial University. In 1928, Kikuchi and Shoji Nishikawa observed and gave a theoretical explanation of the electron backscatter diffraction pattern from a calcite cleavage face.T. Maitland and S. Sitzman, “Electron Backscatter Diffraction (EBSD) Technique and Materials Characterization Examples,” in W. Zhou and Z.L. Wang, eds., ''Scanning Microscopy for Nanotechnology: Techniques and Applications, 2007 Edition'', Springer (2007), , p 41-75. In 1929, he went to Germany as a student and stayed at the University of Göttingen and Leipzig University. In 1934, he was appointed as professor at Osaka Imperial University and directed the construction o ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Walther Kossel
Walther Ludwig Julius Kossel (; 4 January 1888 – 22 May 1956) was a German chemist and physicist known for his theory of the chemical bond (ionic bond/octet rule), Sommerfeld–Kossel displacement law of atomic spectra, the Kossel–Stranski model for crystal growth, and the Kossel effect. Walther was the son of Albrecht Kossel who won the Nobel Prize in Physiology or Medicine in 1910. Career Kossel was born in Berlin, and began studies at the University of Heidelberg in 1906, but was at the University of Berlin during 1907 and 1908. In 1910, he became assistant to Philipp Lenard, who was also his thesis advisor. Kossel was awarded his Ph.D. in 1910, and he stayed on as assistant to Leonard until 1913. In 1913, the year in which Niels Bohr introduced the Bohr model of the atom, Kossel went to the University of Munich as assistant to Arnold Sommerfeld, under whom he did his Habilitation. Under Sommerfeld, Munich was a theoretical center for the developing atomic theory, e ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Inelastic Scattering
In chemistry, nuclear physics, and particle physics, inelastic scattering is a process in which the internal states of a particle or a system of particles change after a collision. Often, this means the kinetic energy of the incident particle is not conserved (in contrast to elastic scattering). Additionally, relativistic collisions which involve a transition from one type of particle to another are referred to as inelastic even if the outgoing particles have the same kinetic energy as the incoming ones. Processes which are governed by elastic collisions at a microscopic level will appear to be inelastic if a macroscopic observer only has access to a subset of the degrees of freedom. In Compton scattering for instance, the two particles in the collision transfer energy causing a loss of energy in the measured particle. Electrons When an electron is the incident particle, the probability of inelastic scattering, depending on the energy of the incident electron, is usually smaller t ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Electric Potential
Electric potential (also called the ''electric field potential'', potential drop, the electrostatic potential) is defined as electric potential energy per unit of electric charge. More precisely, electric potential is the amount of work (physics), work needed to move a test charge from a reference point to a specific point in a static electric field. The test charge used is small enough that disturbance to the field is unnoticeable, and its motion across the field is supposed to proceed with negligible acceleration, so as to avoid the test charge acquiring kinetic energy or producing radiation. By definition, the electric potential at the reference point is zero units. Typically, the reference point is Earth (electricity), earth or a point at infinity, although any point can be used. In classical electrostatics, the electrostatic field is a vector quantity expressed as the gradient of the electrostatic potential, which is a scalar (physics), scalar quantity denoted by or occasi ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
CMOS
Complementary metal–oxide–semiconductor (CMOS, pronounced "sea-moss ", , ) is a type of MOSFET, metal–oxide–semiconductor field-effect transistor (MOSFET) semiconductor device fabrication, fabrication process that uses complementary and symmetrical pairs of p-type semiconductor, p-type and n-type semiconductor, n-type MOSFETs for logic functions. CMOS technology is used for constructing integrated circuit (IC) chips, including microprocessors, microcontrollers, memory chips (including Nonvolatile BIOS memory, CMOS BIOS), and other digital logic circuits. CMOS technology is also used for analog circuits such as image sensors (CMOS sensors), data conversion, data converters, RF circuits (RF CMOS), and highly integrated transceivers for many types of communication. In 1948, Bardeen and Brattain patented an insulated-gate transistor (IGFET) with an inversion layer. Bardeen's concept forms the basis of CMOS technology today. The CMOS process was presented by Fairchild Semico ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Charge-coupled Device
A charge-coupled device (CCD) is an integrated circuit containing an array of linked, or coupled, capacitors. Under the control of an external circuit, each capacitor can transfer its electric charge to a neighboring capacitor. CCD sensors are a major technology used in digital imaging. Overview In a CCD image sensor, pixels are represented by Doping (semiconductor), p-doped metal–oxide–semiconductor (MOS) capacitors. These MOS capacitors, the basic building blocks of a CCD, are biased above the threshold for inversion when image acquisition begins, allowing the conversion of incoming photons into electron charges at the semiconductor-oxide interface; the CCD is then used to read out these charges. Although CCDs are not the only technology to allow for light detection, CCD image sensors are widely used in professional, medical, and scientific applications where high-quality image data are required. In applications with less exacting quality demands, such as consumer and pr ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Electron Microscope
A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that contain information about the surface topography and composition. The electron beam is scanned in a raster scan pattern, and the position of the beam is combined with the intensity of the detected signal to produce an image. In the most common SEM mode, secondary electrons emitted by atoms excited by the electron beam are detected using a secondary electron detector ( Everhart–Thornley detector). The number of secondary electrons that can be detected, and thus the signal intensity, depends, among other things, on specimen topography. Some SEMs can achieve resolutions better than 1 nanometer. Specimens are observed in high vacuum in a conventional SEM, or in low vacuum or wet conditions in a variable pressure or environmental SEM, an ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
EBSD Setup Graphic
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an incident beam of electrons hits a tilted sample. As backscattered electrons leave the sample, they interact with the atoms and are both elastically diffracted and lose energy, leaving the sample at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). The EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. They can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is used for impurities and defect studies, plastic deformation, and statistical analysis fo ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
