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Surface Metrology
Surface metrology is the measurement of small-scale features on surfaces, and is a branch of metrology. Surface primary form, surface fractality, and surface finish (including surface roughness) are the parameters most commonly associated with the field. It is important to many disciplines and is mostly known for the machining of precision parts and assemblies which contain mating surfaces or which must operate with high internal pressures. Surface finish may be measured in two ways: ''contact'' and ''non-contact'' methods. Contact methods involve dragging a measurement stylus across the surface; these instruments are called profilometers. Non-contact methods include: interferometry, digital holography, confocal microscopy, focus variation, structured light, electrical capacitance, electron microscopy, photogrammetry and non-contact profilometers. Overview The most common method is to use a diamond stylus profilometer. The stylus is run perpendicular to the lay of the surfa ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Measurement
Measurement is the quantification of attributes of an object or event, which can be used to compare with other objects or events. In other words, measurement is a process of determining how large or small a physical quantity is as compared to a basic reference quantity of the same kind. The scope and application of measurement are dependent on the context and discipline. In natural sciences and engineering, measurements do not apply to nominal properties of objects or events, which is consistent with the guidelines of the International Vocabulary of Metrology (VIM) published by the International Bureau of Weights and Measures (BIPM). However, in other fields such as statistics as well as the social and behavioural sciences, measurements can have multiple levels, which would include nominal, ordinal, interval and ratio scales. Measurement is a cornerstone of trade, science, technology and quantitative research in many disciplines. Historically, many measurement syste ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Nyquist–Shannon Sampling Theorem
The Nyquist–Shannon sampling theorem is an essential principle for digital signal processing linking the frequency range of a signal and the sample rate required to avoid a type of distortion called aliasing. The theorem states that the sample rate must be at least twice the Bandwidth (signal processing), bandwidth of the signal to avoid aliasing. In practice, it is used to select band-limiting filters to keep aliasing below an acceptable amount when an analog signal is sampled or when sample rates are changed within a digital signal processing function. The Nyquist–Shannon sampling theorem is a theorem in the field of signal processing which serves as a fundamental bridge between continuous-time signals and discrete-time signals. It establishes a sufficient condition for a sample rate that permits a discrete sequence of ''samples'' to capture all the information from a continuous-time signal of finite Bandwidth (signal processing), bandwidth. Strictly speaking, the theorem ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Arithmetic Average
In mathematics and statistics, the arithmetic mean ( ), arithmetic average, or just the ''mean'' or ''average'' is the sum of a collection of numbers divided by the count of numbers in the collection. The collection is often a set of results from an experiment, an observational study, or a survey. The term "arithmetic mean" is preferred in some contexts in mathematics and statistics because it helps to distinguish it from other types of means, such as geometric and harmonic. Arithmetic means are also frequently used in economics, anthropology, history, and almost every other academic field to some extent. For example, per capita income is the arithmetic average of the income of a nation's population. While the arithmetic mean is often used to report central tendencies, it is not a robust statistic: it is greatly influenced by outliers (values much larger or smaller than most others). For skewed distributions, such as the distribution of income for which a few people's incomes ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Statistics
Statistics (from German language, German: ', "description of a State (polity), state, a country") is the discipline that concerns the collection, organization, analysis, interpretation, and presentation of data. In applying statistics to a scientific, industrial, or social problem, it is conventional to begin with a statistical population or a statistical model to be studied. Populations can be diverse groups of people or objects such as "all people living in a country" or "every atom composing a crystal". Statistics deals with every aspect of data, including the planning of data collection in terms of the design of statistical survey, surveys and experimental design, experiments. When census data (comprising every member of the target population) cannot be collected, statisticians collect data by developing specific experiment designs and survey sample (statistics), samples. Representative sampling assures that inferences and conclusions can reasonably extend from the sample ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Structured-light 3D Scanner
A structured-light 3D scanner is a device used to capture the three-dimensional shape of an object by projecting light patterns, such as grids or stripes, onto its surface. The deformation of these patterns is recorded by cameras and processed using specialized algorithms to generate a detailed 3D model. Structured-light 3D scanning is widely employed in fields such as industrial design, quality control, cultural heritage preservation, augmented reality gaming, and medical imaging. Compared to laser-based 3D scanning, structured-light scanners use non-coherent light sources, such as LEDs or projectors, which enable faster data acquisition and eliminate potential safety concerns associated with lasers. However, the accuracy of structured-light scanning can be influenced by external factors, including ambient lighting conditions and the reflective properties of the scanned object. Principle Projecting a narrow band of light onto a three-dimensional surface creates a line of ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Scanning Laser Microscope
Scan, SCAN or Scanning may refer to: Science and technology Computing and electronics * Graham scan, an algorithm for finding the convex hull of a set of points in the plane * 3D scanning, of a real-world object or environment to collect three dimensional data * Counter-scanning, in physical micro and nanotopography measuring instruments like scanning probe microscope * Elevator algorithm or SCAN, a disk scheduling algorithm * Image scanning, an optical scan of images, printed text, handwriting or an object * Optical character recognition, optical recognition of printed text or printed sheet music * Port scanner, in computer networking * Prefix sum, an operation on lists that is also known as the scan operator * Raster scan, the rectangular pattern of image capture and reconstruction in television * Scan chain, a type of manufacturing test used with integrated circuits * Scan line, one line in a raster scanning pattern * Screen reading, on computers to quickly locate text elements ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Confocal Chromatic Aberration
In geometry, confocal means having the same foci: confocal conic sections. * For an optical cavity consisting of two mirrors, confocal means that they share their foci. If they are identical mirrors, their radius of curvature, ''R''mirror, equals ''L'', where ''L'' is the distance between the mirrors. * In conic sections, it is said of two ellipses, two hyperbolas, or an ellipse and a hyperbola which share both foci with each other. If an ellipse and a hyperbola are confocal, they are perpendicular to each other. * In optics, it means that one focus or image point of one lens is the same as one focus of the next lens. See also *Confocal laser scanning microscopy *Confocal microscopy Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique for increasing optical resolution and contrast (vision), contrast of a micrograph by me ... * {{set index article, mathematics Elementary geo ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Focus Variation
Focus variation is a method used to sharpen images and to measure surface irregularities by means of optics with limited depth of field. Algorithm The algorithm works as follows: # At first images with difference focus are captured. This is done by moving the sample or the optics in relation to each other. # Then for each position the focus over each plane is calculated # The plane with the best focus is used to get a sharp image. the corresponding depth gives the depth at this position- Optics Focus variation requires an optics with very little depth of field. This can be realized if a microscopy like optics and a microscope objective is used. These objectives have a high numerical aperture which gives a small depth of field. Usage The use of this method is for optical surface metrology and coordinate-measuring machine. This means measuring form, waviness and roughness on samples.{{cite web , last1=Bermudez , first1=Carlos , title=Active illumination focus variation , url=http ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Confocal Microscopy
Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique for increasing optical resolution and contrast (vision), contrast of a micrograph by means of using a Spatial filter, spatial pinhole to block out-of-focus light in image formation. Capturing multiple two-dimensional images at different depths in a sample enables the reconstruction of three-dimensional structures (a process known as optical sectioning) within an object. This technique is used extensively in the scientific and industrial communities and typical applications are in life sciences, semiconductor inspection and materials science. Light travels through the sample under a conventional microscope as far into the specimen as it can penetrate, while a confocal microscope only focuses a smaller beam of light at one narrow depth level at a time. The CLSM achieves a controlled and highly limited depth of field. Basic c ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
Atomic Force Microscope
Atomic force microscopy (AFM) or scanning force microscopy (SFM) is a very-high-resolution type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the diffraction-limited system, optical diffraction limit. Overview Atomic force microscopy (AFM) gathers information by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning. Despite the name, the Atomic Force Microscope does not use the nuclear force. Abilities and spatial resolution The AFM has three major abilities: force measurement, topographic imaging, and manipulation. In force measurement, AFMs can be used to measure the forces between the probe and the sample as a function of their mutual separation. This can be applied to perform force spectroscopy, to measure the mechanical properties of the sample, s ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
