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Metrology
Metrology is the scientific study of measurement. It establishes a common understanding of Unit of measurement, units, crucial in linking human activities. Modern metrology has its roots in the French Revolution's political motivation to standardise units in France when a length standard taken from a natural source was proposed. This led to the creation of the decimal-based metric system in 1795, establishing a set of standards for other types of measurements. Several other countries adopted the metric system between 1795 and 1875; to ensure conformity between the countries, the ''International Bureau of Weights and Measures, Bureau International des Poids et Mesures'' (BIPM) was established by the Metre Convention. This has evolved into the International System of Units (SI) as a result of a resolution at the 11th General Conference on Weights and Measures (CGPM) in 1960. Metrology is divided into three basic overlapping activities: * The definition of units of measurement * ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
OIML
The International Organization of Legal Metrology ( - OIML), is an intergovernmental organization, intergovernmental organisation that was created in 1955 to promote the global harmonisation of the legal metrology procedures that underpin and facilitate international trade. Such harmonisation ensures that certification of measuring devices in one country is compatible with certification in another, thereby facilitating trade in the measuring devices and in products that rely on the measuring devices. Such products include Weighing scale, weighing devices, Taximeter, taxi meters, speedometers, agricultural measuring devices such as Moisture meter, cereal moisture meters, health related devices such as Exhaust gas, exhaust measurements and Alcohol by volume, alcohol content of drinks. Since its establishment, the OIML has developed a number of guidelines to assist its Members, particularly developing nations, to draw up appropriate legislation concerning metrology across all facets o ... [...More Info...] [...Related Items...] OR: [Wikipedia] [Google] [Baidu] |
