near-field scanning optical microscopy
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Near-field scanning optical microscopy (NSOM) or scanning near-field optical microscopy (SNOM) is a microscopy technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of
evanescent waves In electromagnetics, an evanescent field, or evanescent wave, is an oscillating electric and/or magnetic field that does not propagate as an electromagnetic wave but whose energy is spatially concentrated in the vicinity of the source (oscillati ...
. In SNOM, the excitation
laser A laser is a device that emits light through a process of optical amplification based on the stimulated emission of electromagnetic radiation. The word "laser" is an acronym for "light amplification by stimulated emission of radiation". The fi ...
light is focused through an aperture with a diameter smaller than the excitation wavelength, resulting in an evanescent field (or near-field) on the far side of the aperture. When the sample is scanned at a small distance below the aperture, the optical resolution of transmitted or reflected light is limited only by the diameter of the aperture. In particular, lateral resolution of 6 nm and vertical resolution of 2–5 nm have been demonstrated. As in optical microscopy, the contrast mechanism can be easily adapted to study different properties, such as
refractive index In optics, the refractive index (or refraction index) of an optical medium is a dimensionless number that gives the indication of the light bending ability of that medium. The refractive index determines how much the path of light is bent, or ...
, chemical structure and local stress. Dynamic properties can also be studied at a sub-wavelength scale using this technique. NSOM/SNOM is a form of scanning probe microscopy.


History

Edward Hutchinson Synge is given credit for conceiving and developing the idea for an imaging instrument that would image by exciting and collecting diffraction in the near field. His original idea, proposed in 1928, was based upon the usage of intense nearly planar light from an arc under pressure behind a thin, opaque metal film with a small orifice of about 100 nm. The orifice was to remain within 100 nm of the surface, and information was to be collected by point-by-point scanning. He foresaw the illumination and the detector movement being the biggest technical difficulties. John A. O'Keefe also developed similar theories in 1956. He thought the moving of the pinhole or the detector when it is so close to the sample would be the most likely issue that could prevent the realization of such an instrument. It was Ash and Nicholls at
University College London , mottoeng = Let all come who by merit deserve the most reward , established = , type = Public research university , endowment = £143 million (2020) , budget = ...
who, in 1972, first broke the Abbe’s
diffraction limit The resolution of an optical imaging system a microscope, telescope, or camera can be limited by factors such as imperfections in the lenses or misalignment. However, there is a principal limit to the resolution of any optical system, due to t ...
using microwave radiation with a wavelength of 3 cm. A line grating was resolved with a resolution of λ0/60. A decade later, a patent on an ''optical'' near-field microscope was filed by
Dieter Pohl Dieter Pohl (born 1964) is a German historian and author who specialises in the Eastern European history and the history of mass violence in the 20th century. Education and career Dieter Pohl studied history and political science at the Ludwi ...
, followed in 1984 by the first paper that used visible radiation for near field scanning. The near-field optical (NFO) microscope involved a sub-wavelength aperture at the apex of a metal coated sharply pointed transparent tip, and a feedback mechanism to maintain a constant distance of a few nanometers between the sample and the probe. Lewis et al. were also aware of the potential of an NFO microscope at this time. They reported first results in 1986 confirming super-resolution. In both experiments, details below 50 nm (about λ0/10) in size could be recognized.


Theory

According to Abbe’s theory of image formation, developed in 1873, the resolving capability of an optical component is ultimately limited by the spreading out of each image point due to diffraction. Unless the aperture of the optical component is large enough to collect all the diffracted light, the finer aspects of the image will not correspond exactly to the object. The minimum resolution (d) for the optical component is thus limited by its aperture size, and expressed by the
Rayleigh criterion Angular resolution describes the ability of any image-forming device such as an optical or radio telescope, a microscope, a camera, or an eye, to distinguish small details of an object, thereby making it a major determinant of image resolution. ...
: : d = 0.61 \frac \;\! Here, λ0 is the wavelength in vacuum; NA is the numerical aperture for the optical component (maximum 1.3–1.4 for modern objectives with a very high magnification factor). Thus, the resolution limit is usually around λ0/2 for conventional optical microscopy. This treatment only assumes the light diffracted into the far-field that propagates without any restrictions. NSOM makes use of evanescent or non propagating fields that exist only near the surface of the object. These fields carry the high frequency spatial information about the object and have intensities that drop off exponentially with distance from the object. Because of this, the detector must be placed very close to the sample in the near field zone, typically a few nanometers. As a result, near field microscopy remains primarily a surface inspection technique. The detector is then rastered across the sample using a
piezoelectric Piezoelectricity (, ) is the electric charge that accumulates in certain solid materials—such as crystals, certain ceramics, and biological matter such as bone, DNA, and various proteins—in response to applied mechanical stress. The word '' ...
stage. The scanning can either be done at a constant height or with regulated height by using a feedback mechanism.
Near-Field Scanning Optical Microscopy.
' Olympus America Inc. 12 October 2007.


Modes of operation


Aperture and apertureless operation

There exist NSOM which can be operated in so-called aperture mode and NSOM for operation in a non-aperture mode. As illustrated, the tips used in the apertureless mode are very sharp and do not have a metal coating. Though there are many issues associated with the apertured tips (heating, artifacts, contrast, sensitivity, topology and interference among others), aperture mode remains more popular. This is primarily because apertureless mode is even more complex to set up and operate, and is not understood as well. There are five primary modes of apertured NSOM operation and four primary modes of apertureless NSOM operation. The major ones are illustrated in the next figure. Some types of NSOM operation utilize a
campanile probe In near-field scanning optical microscopy the campanile probe is a tapered optical probe with a shape of a campanile (a square pyramid). It is made of an optically transparent dielectric, typically silica, and its two facets are coated with a m ...
, which has a square pyramid shape with two facets coated with a metal. Such a probe has a high signal collection efficiency (>90%) and no frequency cutoff. Another alternative is "active tip" schemes, where the tip is functionalized with active light sources such as a fluorescent dye or even a light emitting diode that enables fluorescence excitation. The merits of aperture and apertureless NSOM configurations can be merged in a hybrid probe design, which contains a metallic tip attached to the side of a tapered optical fiber. At visible range (400 nm to 900 nm), about 50% of the incident light can be focused to the tip apex, which is around 5 nm in radius. This hybrid probe can deliver the excitation light through the fiber to realize
tip-enhanced Raman spectroscopy Tip-enhanced Raman spectroscopy (TERS) is a variant of surface-enhanced Raman spectroscopy (SERS) that combines scanning probe microscopy with Raman spectroscopy. High spatial resolution chemical imaging is possible ''via'' TERS, with routine demons ...
(TERS) at tip apex, and collect the Raman signals through the same fiber. The lens-free fiber-in-fiber-out STM-NSOM-TERS has been demonstrated.


Feedback mechanisms

Feedback mechanisms are usually used to achieve high resolution and artifact free images since the tip must be positioned within a few nanometers of the surfaces. Some of these mechanisms are constant force feedback and shear force feedback Constant force feedback mode is similar to the feedback mechanism used in atomic force microscopy (AFM). Experiments can be performed in contact, intermittent contact, and non-contact modes. In shear force feedback mode, a tuning fork is mounted alongside the tip and made to oscillate at its resonance frequency. The amplitude is closely related to the tip-surface distance, and thus used as a feedback mechanism.


Contrast

It is possible to take advantage of the various contrast techniques available to optical microscopy through NSOM but with much higher resolution. By using the change in the polarization of light or the intensity of the light as a function of the incident wavelength, it is possible to make use of contrast enhancing techniques such as staining,
fluorescence Fluorescence is the emission of light by a substance that has absorbed light or other electromagnetic radiation. It is a form of luminescence. In most cases, the emitted light has a longer wavelength, and therefore a lower photon energy, tha ...
,
phase contrast Phase-contrast imaging is a method of imaging that has a range of different applications. It exploits differences in the refractive index of different materials to differentiate between structures under analysis. In conventional light microscopy, ph ...
and differential interference contrast. It is also possible to provide contrast using the change in refractive index, reflectivity, local stress and magnetic properties amongst others.


Instrumentation and standard setup

The primary components of an NSOM setup are the light source, feedback mechanism, the scanning tip, the detector and the piezoelectric sample stage. The light source is usually a laser focused into an optical fiber through a polarizer, a beam splitter and a coupler. The polarizer and the beam splitter would serve to remove stray light from the returning reflected light. The scanning tip, depending upon the operation mode, is usually a pulled or stretched optical fiber coated with metal except at the tip or just a standard AFM cantilever with a hole in the center of the pyramidal tip. Standard optical detectors, such as
avalanche photodiode An avalanche photodiode (APD) is a highly sensitive semiconductor photodiode detector that exploits the photoelectric effect to convert light into electricity. From a functional standpoint, they can be regarded as the semiconductor analog of phot ...
,
photomultiplier A photomultiplier is a device that converts incident photons into an electrical signal. Kinds of photomultiplier include: * Photomultiplier tube, a vacuum tube converting incident photons into an electric signal. Photomultiplier tubes (PMTs for sh ...
tube (PMT) or CCD, can be used. Highly specialized NSOM techniques, Raman NSOM for example, have much more stringent detector requirements.


Near-field spectroscopy

As the name implies, information is collected by spectroscopic means instead of imaging in the near field regime. Through Near Field Spectroscopy (NFS), one can probe spectroscopically with sub-wavelength resolution. Raman SNOM and fluorescence SNOM are two of the most popular NFS techniques as they allow for the identification of nanosized features with chemical contrast. Some of the common near-field spectroscopic techniques are below. Direct local Raman NSOM is based on Raman spectroscopy. Aperture Raman NSOM is limited by very hot and blunt tips, and by long collection times. However, apertureless NSOM can be used to achieve high Raman scattering efficiency factors (around 40). Topological artifacts make it hard to implement this technique for rough surfaces.
Tip-enhanced Raman spectroscopy Tip-enhanced Raman spectroscopy (TERS) is a variant of surface-enhanced Raman spectroscopy (SERS) that combines scanning probe microscopy with Raman spectroscopy. High spatial resolution chemical imaging is possible ''via'' TERS, with routine demons ...
(TERS) is an offshoot of
surface enhanced Raman spectroscopy Surface-enhanced Raman spectroscopy or surface-enhanced Raman scattering (SERS) is a surface-sensitive technique that enhances Raman scattering by molecules adsorbed on rough metal surfaces or by nanostructures such as plasmonic-magnetic silica n ...
(SERS). This technique can be used in an apertureless shear-force NSOM setup, or by using an AFM tip coated with gold or silver. The Raman signal is found to be significantly enhanced under the AFM tip. This technique has been used to give local variations in the Raman spectra under a single-walled nanotube. A highly sensitive optoacoustic spectrometer must be used for the detection of the Raman signal. Fluorescence NSOM is a highly popular and sensitive technique which makes use of fluorescence for near field imaging, and is especially suited for biological applications. The technique of choice here is apertureless back to the fiber emission in constant shear force mode. This technique uses merocyanine-based dyes embedded in an appropriate resin. Edge filters are used for removal of all primary laser light. Resolution as low as 10 nm can be achieved using this technique. Near field infrared spectrometry and near-field dielectric microscopy use near-field probes to combine sub-micron microscopy with localized IR spectroscopy. The nano-FTIR method is a broadband nanoscale spectroscopy that combines apertureless NSOM with broadband illumination and FTIR detection to obtain a complete infrared spectrum at every spatial location. Sensitivity to a single molecular complex and nanoscale resolution up to 10 nm has been demonstrated with nano-FTIR. The nanofocusing technique can create a nanometer-scale "white" light source at the tip apex, which can be used to illuminate a sample at near-field for spectroscopic analysis. The interband optical transitions in individual single-walled carbon nanotubes are imaged and a spatial resolution around 6 nm has been reported.


Artifacts

NSOM can be vulnerable to artifacts that are not from the intended contrast mode. The most common root for artifacts in NSOM are tip breakage during scanning, striped contrast, displaced optical contrast, local far field light concentration, and topographic artifacts. In apertureless NSOM, also known as scattering-type SNOM or s-SNOM, many of these artifacts are eliminated or can be avoided by proper technique application.


Limitations

One limitation is a very short working distance and extremely shallow depth of field. It is normally limited to surface studies; however, it can be applied for subsurface investigations within the corresponding depth of field. In shear force mode and other contact operation it is not conducive for studying soft materials. It has long scan times for large sample areas for high resolution imaging.


See also

* Nano-optics *
Fluorescence spectroscopy Fluorescence spectroscopy (also known as fluorimetry or spectrofluorometry) is a type of electromagnetic spectroscopy that analyzes fluorescence from a sample. It involves using a beam of light, usually ultraviolet light, that excites the electro ...
*
Near-field optics Near-field optics is that branch of optics that considers configurations that depend on the passage of light to, from, through, or near an element with subwavelength features, and the coupling of that light to a second element located a subwaveleng ...


References


External links

* {{Optical microscopy Scanning probe microscopy Cell imaging Laboratory equipment Microscopy Optical microscopy